Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Nuclear Science, 2(65), p. 732-738, 2018
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Microbeam SEE Analysis of MIM Capacitors for GaN Amplifiers
Journal article published in 2018 by
Pawel Kupsc 
,
Arto Javanainen ,
Veronique Ferlet-Cavrois,
Michele Muschitiello ,
Andrew Barnes,
Ali Zadeh,
Jordan Calcutt,
Christian Poivey,
Hermann Stieglauer,
Kay-Obbe Voss
,
Arto Javanainen ,
Veronique Ferlet-Cavrois,
Michele Muschitiello ,
Andrew Barnes,
Ali Zadeh,
Jordan Calcutt,
Christian Poivey,
Hermann Stieglauer,
Kay-Obbe Voss
This paper was not found in any repository, but could be made available legally by the author.
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