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Wiley, Journal of Raman Spectroscopy, 8(47), p. 963-970

DOI: 10.1002/jrs.4916

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Probing charge carrier compensation in high energy ion irradiated III–V semiconductor by Raman spectroscopy and Hall measurements

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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