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Active thermal control by controlled shoot-through of power devices
UploadModeling of Short-Circuit-Related Thermal Stress in Aged IGBT Modules
Download from vbn.aau.dkCapacitive effects in IGBTs limiting their reliability under short circuit
Download from vbn.aau.dkTCAD analysis of short-circuit oscillations in IGBTs
Download from vbn.aau.dkIR Camera Validation of IGBT Junction Temperature Measurement via Peak Gate Current
Download from hal.archives-ouvertes.frSimultaneous On-State Voltage and Bond-Wire Resistance Monitoring of Silicon Carbide MOSFETs
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