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Elsevier, Microelectronics Reliability, (76-77), p. 485-489

DOI: 10.1016/j.microrel.2017.07.059

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Capacitive effects in IGBTs limiting their reliability under short circuit

Journal article published in 2017 by P. D. Reigosa ORCID, F. Iannuzzo ORCID, M. Rahimo, F. Blaabjerg
This paper is available in a repository.
This paper is available in a repository.

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