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All papers authored by Victor Yon

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2020 Mrad Mrad, Christophe Licitra, Amélie Dussaigne, Victor Yon

ORCID

, Jérôme Richy, Matthieu Lafossas, Joel Kanyandekwe, Guy Feuillet, Matthew Charles

ORCID

Unravelling the unwanted Ga incorporation effect on InGaN epilayers grown in CCS MOVPE reactors

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Victor Yon

ORCID

, Névine Rochat, Matthew Charles, Emmanuel Nolot, Patrice Gergaud

X‐Ray Diffraction Microstrain Analysis for Extraction of Threading Dislocation Density of GaN Films Grown on Silicon, Sapphire, and SiC Substrates

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2019 Matthew Charles

ORCID

, Mrad Mrad, Joël Kanyandekwe, Victor Yon

ORCID

Extraction of stress and dislocation density using in-situ curvature measurements for AlGaN and GaN on silicon growth

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