Shigeru Kimura
0000-0003-1064-7572
Japan Synchrotron Radiation Research Institute
87 papers found
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Silicon Surface Imperfection Probed with a Novel X-Ray Diffraction Technique and Its Influence on the Reliability of Thermally Grown Silicon Oxide
Minute Strain Fields due to Vacancy Type Defects in a Rapidly Cooled Czochralski-Grown Silicon Crystal
Novel Process for Visible Light Emission from Si Prepared by Ion Irradiation
Surface-selective x-ray topographic observations of mechanochemical polished silicon surfaces using synchrotron radiation
Contrast formation mechanism for the surface defects imaged by x-ray topography under the condition of simultaneous specular and Bragg reflections
Analysis of minute strain fields around A-swirl defects in a float zone silicon crystal by means of plane wave X-ray topography using extremely collimated X-rays
X-ray measurements of the crystal truncation rod scattering from cleavage surfaces of ionic crystals
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