Karen L. Kavanagh

Papers authored by Karen L. Kavanagh

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2002 M. Adamcyk, J. H. Schmid, T. Tiedje, A. Koveshnikov, A. Chahboun, V. Fink, K. L. Kavanagh

Comparison of strain relaxation in InGaAsN and InGaAs thin films

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A. Chahboun, V. Fink, M. Fleischauer, K. L. Kavanagh

, R. P. Lu, L. Hansen, C. R. Becker, L. W. Molenkamp

Ballistic electron emission microscopy studies of ZnSe–BeTe heterojunctions

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R. P. Lu, K. L. Kavanagh

, St. J. Dixon Warren, A. J. SpringThorpe, R. Streater, I. Calder

Scanning spreading resistance microscopy current transport studies on doped III–V semiconductors

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2001 V. Fink, E. Chevalier, O. J. Pitts, M. W. Dvorak, K. L. Kavanagh

, C. R. Bolognesi, S. Hummel, S. P. Watkins, N. Moll

Anisotropic resistivity correlated with atomic ordering in p-type GaAsSb

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W. B. Dubbelday, K. L. Kavanagh

The growth of SiGe on sapphire using rapid thermal chemical vapor deposition

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M. Adamcyk, S. Tixier, B. J. Ruck, J. H. Schmid, T. Tiedje, V. Fink, M. Jeffries, D. Karaiskaj, K. L. Kavanagh

, M. Thewalt

Faceting transition in epitaxial growth of dilute GaNAs films on GaAs

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R. P. Lu, K. L. Kavanagh

, St. J. Dixon Warren, A. Kuhl, A. J. SpringThorpe, E. Griswold, G. Hillier, I. Calder, R. Arés, R. Aré, R. Streater

Calibrated scanning spreading resistance microscopy profiling of carriers in III–V structures

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Paul F. Miceli, Tom Tiedje, Christian Lavoie, Kaile Li, Karen L. Kavanagh

X-Ray Diffuse Scattering from Misfit Dislocation at Buried Interface

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2000 H. P. Xin, K. L. Kavanagh

, C. W. Tu

Gas-source molecular beam epitaxial growth and thermal annealing of GaInNAs/GaAs quantum wells

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1999 Shapiro Al, A. L. Shapiro, O. Vajk, F. Hellman, K. M. Ring, K. L. Kavanagh

Suppression of growth-induced perpendicular magnetic anisotropy in Co–Pt alloys by trace amounts of Si

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H. P. Xin, K. L. Kavanagh

, M. Kondow, C. W. Tu

Effects of rapid thermal annealing on GaInNAs/GaAs multiple quantum wells

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Suraj J. Mathew, Guofu Niu, Guofu Niu, Wadad B. Dubbelday, John D. Cressler, John A. Ott, Jack O. Chu, Patricia M. Mooney, Karen L. Kavanagh

, Bernard S. Meyerson, Isaac Lagnado

Hole confinement and low-frequency noise in SiGe pFETs on silicon-on-sapphire

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Karen L. Kavanagh

Atomic interface structure-property investigations

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1997 Karen L. Kavanagh

In-situ measurement of roughness spectra using diffuse scattering

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C. Lavoie, B. Leduc, T. Pinnington, T. Tiedje, D. Klug, R. S. Goldman, J. Tse, K. L. Kavanagh

In situ detection of misfit dislocations by light scattering

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This paper was not found in any repository; the policy of its publisher is unknown or unclear.

K. L. Kavanagh

High-temperature epitaxy of PtSi/Si(0 0 1)

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1996 B. A. Morgan, A. A. Talin, W. G. Bi, K. L. Kavanagh

, R. S. Williams, C. W. Tu, T. Yasuda, T. Yasui, Y. Segawa

Comparison of Au contacts to Si, GaAs, InxGa1 − xP, and ZnSe measured by ballistic electron emission microscopy

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Ken M. Ring, A. Alec Talin, R. Stanley Williams, Takashi Yasuda, Takanari Yasui, Yusaburo Segawa, Karen L. Kavanagh

, Brent A. Morgan

Au/ZnSe contacts characterized by ballistic electron emission microscopy

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K. L. Kavanagh

BEEM and UHV-TEM studies of PtSi/Si(001)

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1995 C. Lavoie, T. Pinnington, E. Nodwell, T. Tiedje, R. S. Goldman, K. L. Kavanagh

, J. L. Hutter

Relationship between surface morphology and strain relaxation during growth of InGaAs strained layers

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Papers authored by Karen L. Kavanagh