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All papers authored by Zheyang Zheng

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2022 Jiahui Sun

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, Zheyang Zheng

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, Gang Lyu

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, Kevin J. Chen

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Short-Circuit Failure Mechanisms of 650-V GaN/SiC Cascode Devices in Comparison With SiC MOSFETs

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2021 Zheyang Zheng

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, Li Zhang

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, Tao Chen

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, Sirui Feng, Yat Hon Ng, Jiahui Sun

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, Han Xu

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, Jin Wei

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, Kevin J. Chen

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Threshold Voltage Instability of Enhancement-Mode GaN Buried p-Channel MOSFETs

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Jiahui Sun

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, Zheyang Zheng

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, Gang Lyu

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, Kevin J. Chen

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Impact of Drain Leakage Current on Short Circuit Behavior of GaN/SiC Cascode Devices

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Jiahui Sun

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, Jin Wei

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, Zheyang Zheng

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, Kevin J. Chen

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Short Circuit Capability Characterization and Analysis of p-GaN Gate High-Electron-Mobility Transistors Under Single and Repetitive Tests

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2020 Gang Lyu

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, Jin Wei

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, Zheyang Zheng

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, Kevin J. Chen

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A Normally-off Copackaged SiC-JFET/GaN-HEMT Cascode Device for High-Voltage and High-Frequency Applications

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2019 Jiahui Sun

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, Jin Wei

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, Zheyang Zheng

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, Kevin J. Chen

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Short Circuit Capability and Short Circuit Induced $V_{\mathrm{TH}}$ Instability of a 1.2-kV SiC Power MOSFET

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2018 Jiacheng Lei

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, Jin Wei

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, Zheyang Zheng

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, Kevin J. Chen

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Reverse-Blocking Normally-OFF GaN Double-Channel MOS-HEMT With Low Reverse Leakage Current and Low ON-State Resistance

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Mengyuan Hua

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, Jin Wei

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, Qilong Bao, Zhaofu Zhang

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, Zheyang Zheng

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, Kevin J. Chen

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Dependence of ${V}_{\text {TH}}$ Stability on Gate-Bias Under Reverse-Bias Stress in E-mode GaN MIS-FET

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