Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Nuclear Science, 1(65), p. 175-183, 2018
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Capacitance–Frequency Estimates of Border-Trap Densities in Multifin MOS Capacitors
Journal article published in 2018 by
Simeng E. Zhao 
,
Rong Jiang ,
En Xia Zhang ,
Wenjun Liao ,
Chundong Liang ,
Daniel M. Fleetwood ,
Ronald D. Schrimpf ,
Robert A. Reed,
Dimitri Linten,
Jerome Mitard,
Nadine Collaert,
Sonja Sioncke,
Niamh Waldron
,
Rong Jiang ,
En Xia Zhang ,
Wenjun Liao ,
Chundong Liang ,
Daniel M. Fleetwood ,
Ronald D. Schrimpf ,
Robert A. Reed,
Dimitri Linten,
Jerome Mitard,
Nadine Collaert,
Sonja Sioncke,
Niamh Waldron
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