Metrology with Atom Interferometry: Inertial Sensors from Laboratory to Field Applications

Fang, B.; Dutta, I.; Gillot, P.; Savoie, D.; Lautier, J.; Cheng, B.; Garrido Alzar, C. L.; Geiger, R.; Merlet, S.; Pereira Dos Santos, F.; Landragin, A.

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IOP Publishing, Journal of Physics: Conference Series, (723), p. 012049, 2016

DOI: 10.1088/1742-6596/723/1/012049

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Metrology with Atom Interferometry: Inertial Sensors from Laboratory to Field Applications

Journal article published in 2016 by B. Fang, I. Dutta, P. Gillot, D. Savoie, J. Lautier, B. Cheng, C. L. Garrido Alzar, R. Geiger, S. Merlet, F. Pereira Dos Santos

, A. Landragin

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Metrology with Atom Interferometry: Inertial Sensors from Laboratory to Field Applications