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IOP Publishing, Chinese Physics Letters, 11(34), p. 118501

DOI: 10.1088/0256-307x/34/11/118501

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Influence of Total Ionizing Dose Irradiation on Low-Frequency Noise Responses in Partially Depleted SOI nMOSFETs

Journal article published in 2017 by Chao Peng, Yun-Fei En, Zhi-Feng Lei, Yi-Qiang Chen, Yuan Liu, Bin Li
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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