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Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 10(64), p. 4099-4105, 2017

DOI: 10.1109/ted.2017.2742578

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Probing the Critical Region of Conductive Filament in Nanoscale HfO2 Resistive-Switching Device by Random Telegraph Signals

Journal article published in 2017 by Zheng Chai, Jigang Ma, Wei Dong Zhang ORCID, Bogdan Govoreanu, Jian Fu Zhang ORCID, Zhigang Ji ORCID, Malgorzata Jurczak
This paper is available in a repository.
This paper is available in a repository.

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