Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 10(64), p. 4011-4017, 2017
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NBTI-Generated Defects in Nanoscaled Devices: Fast Characterization Methodology and Modeling
Journal article published in 2017 by
Rui Gao,
Zhigang Ji 
,
Azrif B. Manut,
Jian Fu Zhang ,
Jacopo Franco,
Sharifah Wan Muhamad Hatta ,
Wei Dong Zhang ,
Ben Kaczer,
Dimitri Linten,
Guido Groeseneken
,
Azrif B. Manut,
Jian Fu Zhang ,
Jacopo Franco,
Sharifah Wan Muhamad Hatta ,
Wei Dong Zhang ,
Ben Kaczer,
Dimitri Linten,
Guido Groeseneken
This paper is made freely available by the publisher.
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