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2014 International Symposium on Next-Generation Electronics (ISNE)

DOI: 10.1109/isne.2014.6839380

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Investigation into microstructural and electrical characteristics of Ni-Cr-Si thin-film resistors deposited in Al2O3 substrate using DC and RF magnetron sputtering

Proceedings article published in 2014 by Chen-Su Chiang, Wen-Hsi Lee, Franco Jap
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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