Published in
2007 International Conference on Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems. EuroSime 2007
DOI: 10.1109/esime.2007.360040
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Numerical Simulation of Ion Drift within Ion Mobility Spectrometers in High Peclet Conditions using FEM Techniques
Proceedings article published in 2007 by
A. Kalms,
M. Salleras 
,
Z. Liu,
J. G. Korvink ,
J. Goebel,
G. Mueller,
G. Muller,
J. Samitier,
S. Marco
,
Z. Liu,
J. G. Korvink ,
J. Goebel,
G. Mueller,
G. Muller,
J. Samitier,
S. Marco
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