Abstract Self-assembled Al _y Ga_{1− y} N quantum dots (QDs), with y = 0 and 0.1, have been grown by molecular beam epitaxy on Al_0.5Ga_0.5N(0001) oriented layers using sapphire substrates. The QD formation has been followed in situ by reflection high energy electron diffraction (RHEED). A two- to three-dimensional (2D–3D) transition of the layer morphology is observed, characterized by a change of the RHEED pattern from streaky lines to Bragg spots. High QD densities, from 10¹⁰ up to near 10¹² cm⁻², have been obtained. By decreasing the GaN QD size and incorporating Al inside the QDs, a strong variation in the photoluminescence (PL) emission has been observed, enabling to cover a large spectral range from near UV (3 eV) to UV-B (3.95 eV). By combining temperature-dependent and time-resolved PL measurements, the internal quantum efficiency of the QDs has been determined at both low and high temperatures as a function of the PL energy.