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Springer Verlag, Springer Proceedings in Physics, p. 273-277

DOI: 10.1007/978-3-319-73025-7_40

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The observation of transient thin film structures during the femto-second laser ablation process by using the soft x-ray laser probe

Book chapter published in 2016 by N. Hasegawa, 登. 長谷川, 長谷川登, 錦野, 石野 雅彦, 大西直史, 伊藤篤史, 南康夫, 馬場基芳, 河内 哲哉, M. Nishikino, 末元徹, M. Ishino, N. Ohnishi, A. M. Ito and other authors.
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

We have improved a soft x-ray laser interferometer synchronized with a Ti:Sapphire laser pulse to observe the single-shot image of the nano-scaled structure dynamics of the laser induced materials. By using this system, we have succeeded in the observation of the thin film structures above the solid (or liquid) surface in the femto-second laser ablation process of metals (Au). ; The 15th International Conference on X-Ray Lasers