Published in
Cambridge University Press, Microscopy and Microanalysis, S2(18), p. 532-533, 2012
DOI: 10.1017/s1431927612004515
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Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope
Journal article published in 2012 by
P. Wang,
A. I. Kirkland,
P. D. Nellist,
A. J. D’Alfonso,
A. J. Morgan 
,
L. J. Allen,
A. Hashimoto,
M. Takeguchi,
K. Mitsuishi,
M. Shimojo
,
L. J. Allen,
A. Hashimoto,
M. Takeguchi,
K. Mitsuishi,
M. Shimojo
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Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.