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Published in

Cambridge University Press, Microscopy and Microanalysis, S2(14), p. 610-611, 2008

DOI: 10.1017/s1431927608087229

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Non-Contact 3D Surface Metrology of Large Grain High Purity Niobium by SLCM and FESEM

Journal article published in 2008 by Zh Sung, Pj Lee ORCID, Dc Larbalestier ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

Full text: Unavailable

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Data provided by SHERPA/RoMEO

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008