Published in
Society of Photo-optical Instrumentation Engineers, Proceedings of SPIE, 2015
DOI: 10.1117/12.2087231
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In-line print defect inspection system based on parallelized algorithms
Proceedings article published in 2015 by
Chao Lv,
Hongjun Zhou
This paper was not found in any repository, but could be made available legally by the author.
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