Published in
Elsevier, Materials Chemistry and Physics: Including Materials Science Communications, 2-3(46), p. 224-229
DOI: 10.1016/s0254-0584(97)80017-x
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Comparison of Au contacts to Si, GaAs, InxGa1 − xP, and ZnSe measured by ballistic electron emission microscopy
Journal article published in 1996 by
B. A. Morgan,
A. A. Talin,
W. G. Bi,
K. L. Kavanagh 
,
R. S. Williams,
C. W. Tu,
T. Yasuda,
T. Yasui,
Y. Segawa
,
R. S. Williams,
C. W. Tu,
T. Yasuda,
T. Yasui,
Y. Segawa
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