Published in
IOP Publishing, Nanotechnology, 2(14), p. 332-340
DOI: 10.1088/0957-4484/14/2/345
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Electrostatic force gradient signal: resolution enhancement in electrostatic force microscopy and improved Kelvin probe microscopy
Journal article published in 2003 by
A. Gil,
J. G mez-Herrero,
J. Colchero 
,
J. G mez-Herrero,
A. M. Bar
,
J. G mez-Herrero,
A. M. Bar
This paper was not found in any repository, but could be made available legally by the author.
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