IOP Publishing, Journal of Optics A: Pure and Applied Optics, 4(5), p. 418-424
DOI: 10.1088/1464-4258/5/4/318
Full text: Unavailable
This paper describes a method for calculating the phase profile of digitized interferograms obtained from a phase shifting interferometer. A phase-retrieval algorithm is presented which uses total least-squares fitting of the ellipses obtained when one of the intensity profiles is plotted against the others. A propagation-of-error analysis and experimental results are also given.