Published in
Elsevier, Ultramicroscopy, 8(110), p. 946-951
DOI: 10.1016/j.ultramic.2009.11.005
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Cs corrected STEM EELS: Analysing beam sensitive carbon nanomaterials in cellular structures
Journal article published in 2010 by
Mhairi H. Gass,
Alexandra E. Porter,
James S. Bendall,
Karin Muller,
Jeremy N. Skepper,
Paul A. Midgley,
Mark Welland
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