Short-wavelength infrared defect emission as a probe of degradation processes in 980 nm single-mode diode lasers
Journal article published in 2014 by
Martin Hempel 
,
Jens W. Tomm,
Fangyu Yue,
Mauro A. Bettiati,
Thomas Elsaesser
,
Jens W. Tomm,
Fangyu Yue,
Mauro A. Bettiati,
Thomas Elsaesser
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