Links

Tools

Export citation

Search in Google Scholar

Characterizing transport current defects in 1-cm-wide YBa[sub 2]Cu[sub 3]O[sub 7-delta] coated conductors.

This paper was not found in any repository; the policy of its publisher is unknown or unclear.
This paper was not found in any repository; the policy of its publisher is unknown or unclear.

Full text: Unavailable

Question mark in circle
Preprint: policy unknown
Question mark in circle
Postprint: policy unknown
Question mark in circle
Published version: policy unknown

Abstract

We have used a low temperature magnetic imaging system to determine current pathways in 5 cm long 'good' and 'bad' regions of a 1-cm-wide YBa2Cu3O7-{delta} coated conductor. The good and bad regions were identified with 4 point probe measurements taken at 1 cm intervals along the tape length. The current density map from the good region showed the expected edge peaked structure, similar to that seen in previous work on high quality test samples grown on single crystal substrates. The structure was also consistent with theoretical understanding of thin film superconductors where demagnetizing effects are strong. The maps from the bad region showed that the current was primarily confined to the right half of the sample. The left half carried only a small current that reached saturation quickly. Effectively halving the sample width quantitatively explains the critical current measured in that section. Spatially resolved xray analysis with 1 mm resolution was used to further characterize the bad section and suggested an abnormally large amount of a-axis YBCO present. This may be the result of non-uniform heating leading to a low deposition temperature in that area.