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Microstructural development and control in YBa[sub 2]Cu[sub 3]O[sub y]

This paper was not found in any repository; the policy of its publisher is unknown or unclear.
This paper was not found in any repository; the policy of its publisher is unknown or unclear.

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Abstract

A study of some defect structures in Y{sub 1}Ba{sub 2}Cu{sub 3}O{sub 7} (Y-123)coated conductors based on ion-beam -assisted-deposition (IBAD) of yttria-stabilized zirconia (YSZ) on nickel alloy substrates is presented. Defect structures can originate anywhere in the coated conductor architecture. Defects can be additive and propagate through the entire film structure to affect the growth, orientation, arid properties of the superconducting film. Interfacial Ieactions between Y- 123 and the underlying buffer layer and the corresponding effects on the transport properticis of the films can be controlled with the thickness of the underlying buffer layer. With a 9Ow ceria buffer layer on an IBAD YSZ coated metal substrate, a J, value of 1.7 MA/cm{sup 2} (self-field, 75K) was obtained in a 1.5{micro}m thick Y-123 film.