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Cambridge University Press, Microscopy and Microanalysis, S6(21), p. 96-97, 2015

DOI: 10.1017/s1431927614014184

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Characterization of nanolayers at TiAl diffusion bonds

Journal article published in 2015 by S. Simões ORCID, F. Viana, A. S. Ramos, M. T. Vieira, M. F. Vieira ORCID
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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