Published in
IOP Publishing, Japanese Journal of Applied Physics, 8R(36), p. 5356, 1997
DOI: 10.1143/jjap.36.5356
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Simulation of Monolithic Silicon LLL Scanning X-Ray Interferometer
Journal article published in 1997 by
Giuseppe Bertolotto Bianc,
Bianc Gb,
Giovanni Mana 
,
Gianfranco Zosi
,
Gianfranco Zosi
This paper was not found in any repository, but could be made available legally by the author.
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Abstract
A model of a monolithic silicon LLL scanning X-ray interferometer capable of displacements up to 100 mu m is described. It can be used for the measurement of the (2 (2) over bar 0) lattice plane spacing of silicon in studies concerning the Avogadro constant and for the calibration of linear displacement transducers having sub-nanometer sensitivity.