Published in
American Institute of Physics, Journal of Applied Physics, 8(110), p. 084514
DOI: 10.1063/1.3656026
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Surface roughness scattering model for arbitrarily oriented silicon nanowires
Journal article published in 2011 by
Isabel M. Tienda-Luna,
F. G. Ruiz,
A. Godoy,
B. Biel 
,
F. Gámiz,
F. Gámiz
,
F. Gámiz,
F. Gámiz
This paper was not found in any repository, but could be made available legally by the author.
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