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American Institute of Physics, Applied Physics Letters, 14(94), p. 142503

DOI: 10.1063/1.3114372

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Relevance of length scales in exchange biased submicron dots

Journal article published in 2009 by Zhi-Pan Li, R. Morales, Ivan K. Schuller
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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