Published in
American Institute of Physics, Applied Physics Letters, 8(80), p. 1462
DOI: 10.1063/1.1453475
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Performing current versus voltage measurements of single-walled carbon nanotubes using scanning force microscopy
Journal article published in 2002 by
P. J. de Pablo,
C. Gómez-Navarro,
M. T. Martı́nez,
A. M. Benito,
W. K. Maser,
J. Colchero 
,
J. Gómez-Herrero,
A. M. Baró
,
J. Gómez-Herrero,
A. M. Baró
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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