Published in
American Institute of Physics, Applied Physics Letters, 9(77), p. 1286
DOI: 10.1063/1.1290048
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High-resolution microbeam x-ray diffractometry applied to InGaAsP/InP layers grown by narrow-stripe selective metal-organic vapor phase epitaxy
Journal article published in 2000 by
Shigeru Kimura 
,
Hidekazu Kimura,
Kenji Kobayashi,
Tomoaki Oohira,
Koich Izumi,
Yasutaka Sakata,
Yoshiyuki Tsusaka,
Kazushi Yokoyama,
Shingo Takeda,
Masafumi Urakawa,
Yasushi Kagoshima,
Junji Matsui
,
Hidekazu Kimura,
Kenji Kobayashi,
Tomoaki Oohira,
Koich Izumi,
Yasutaka Sakata,
Yoshiyuki Tsusaka,
Kazushi Yokoyama,
Shingo Takeda,
Masafumi Urakawa,
Yasushi Kagoshima,
Junji Matsui
This paper was not found in any repository, but could be made available legally by the author.
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