Published in
American Institute of Physics, Applied Physics Letters, 10(108), p. 102402
DOI: 10.1063/1.4943228
Links
Tools
Parameter-free determination of the exchange constant in thin films using magnonic patterning
Journal article published in 2016 by
M. Langer,
K. Wagner,
T. Sebastian,
R. Hübner,
J. Grenzer,
Yutian Wang,
T. Kubota,
T. Schneider,
S. Stienen,
K. Lenz,
H. Schultheiß,
J. Lindner,
K. Takanashi,
R. E. Arias,
J. Fassbender 
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Data provided by 