Published in
American Institute of Physics, Journal of Vacuum Science and Technology B, 3(33), p. 031212
DOI: 10.1116/1.4919237
Links
Tools
Degradation mechanisms of Ti/Al/Ni/Au-based Ohmic contacts on AlGaN/GaN HEMTs
Journal article published in 2015 by
Ya-Hsi Hwang,
Shihyun Ahn,
Chen Dong,
Weidi Zhu,
Byung-Jae Kim,
Lingcong Le,
Fan Ren,
Aaron G. Lind,
James Dahl,
Kevin S. Jones,
Stephen J. Pearton,
Ivan I. Kravchenko,
Ming-Lan Zhang
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Data provided by 