Published in

IOP Publishing, Applied Physics Express, 5(3), p. 054201, 2010

DOI: 10.1143/apex.3.054201

Links

Tools

Export citation

Search in Google Scholar

Novel Vertical Heterojunction Field-Effect Transistors with Re-grown AlGaN/GaN Two-Dimensional Electron Gas Channels on GaN Substrates

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

Full text: Unavailable

Green circle
Preprint: archiving allowed
Orange circle
Postprint: archiving restricted
Red circle
Published version: archiving forbidden
Data provided by SHERPA/RoMEO

Abstract

Novel vertical heterojunction field-effect transistors (VHFETs) with re-grown AlGaN/GaN two-dimensional electron gas (2DEG) channels on freestanding GaN substrates have been developed. The VHFETs exhibited a specific on-resistance (RonA) of 7.6 m Omega cm(2) at a threshold voltage (V(TH)) of -1: 1 V and a breakdown voltage (V(B)) of 672 V. The breakdown voltage and the figure of merit (V(B)(2)/R(on)A) are the highest among those of the GaN-based vertical transistors ever reported. It was demonstrated that the threshold voltage can be controlled by the thickness of AlGaN layers and a normally-off operation was achieved with a 10-nm-thick Al(0:2)Ga(0:8)N layer. (C) 2010 The Japan Society of Applied Physics