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2012 Workshop on Fault Diagnosis and Tolerance in Cryptography

DOI: 10.1109/fdtc.2012.13

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Harnessing Biased Faults in Attacks on ECC-Based Signature Schemes

Proceedings article published in 2012 by Kimmo Jarvinen, Celine Blondeau, Dan Page, Michael Tunstall
This paper is available in a repository.
This paper is available in a repository.

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Abstract

This paper presents an extension of the byte-fault attack on signature schemes presented by Giraud et al. Our work extends their attack in a number of ways, but the main focus is an alternative fault model motivated by existing fault injection results. Instead of assuming faults are uniformly distributed (i.e., a given bit is flipped with probability 1/2), we consider the case where faults are biased (i.e., the probability differs from 1/2). Our results show that injecting biased faults allows an attacker to reveal security-critical data with significantly fewer faults and/or a significantly faster search through the remaining candidates.