This work is licensed under a Creative Commons Attribution 4.0 International License.-- et al. ; Anatase is a pivotal material in devices for energy-harvesting applications and catalysis. Methods for the accurate characterization of this reducible oxide at the atomic scale are critical in the exploration of outstanding properties for technological developments. Here we combine atomic force microscopy (AFM) and scanning tunnelling microscopy (STM), supported by first-principles calculations, for the simultaneous imaging and unambiguous identification of atomic species at the (101) anatase surface. We demonstrate that dynamic AFM-STM operation allows atomic resolution imaging within the material’s band gap. Based on key distinguishing features extracted from calculations and experiments, we identify candidates for the most common surface defects. Our results pave the way for the understanding of surface processes, like adsorption of metal dopants and photoactive molecules, that are fundamental for the catalytic and photovoltaic applications of anatase, and demonstrate the potential of dynamic AFM-STM for the characterization of wide band gap materials. ; Work supported by the NIMS (AA002 and AF006 projects), by the MEXT KAKENHI Grant Number 26104540, by the Charles University (GAUK 339311) and by the Spanish MINECO (projects PLE2009-0061, MAT2011-023627 and CSD2010-00024). O.S and V.M. thank the Charles University-NIMS International Cooperative Graduate School Program. J.W.R. thanks NIMS for funding through the NIMS Internship Program and ICIQ for his ICIQ Fellowship. ; Peer Reviewed