Links

Tools

Export citation

Search in Google Scholar

An Experimental Fault Injection Attack on RSA Cryptosystem using Abnormal Source Voltage

Journal article published in 2009 by Jea-Hoon Park, Sang-Jae Moon, Jae-Cheol Ha
This paper was not found in any repository; the policy of its publisher is unknown or unclear.
This paper was not found in any repository; the policy of its publisher is unknown or unclear.

Full text: Unavailable

Question mark in circle
Preprint: policy unknown
Question mark in circle
Postprint: policy unknown
Question mark in circle
Published version: policy unknown

Abstract

CRT-based RSA algorithm, which was implemented on smartcard, microcontroller and so on, leakages secret primes p and q by fault attacks using laser injection, EM radiation, ion beam injection, voltage glitch injection and so on. Among the many fault injection methods, voltage glitch can be injected to target device without any modification, so more practical. In this paper, we made an experiment on the fault injection attack using abnormal source voltage. As a result, CRT-RSA's secret prime p and q are disclosed by fault attack with voltage glitch injection which was introduced by several previous papers, and also succeed the fault attack with source voltage blocking for proper period.