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American Institute of Physics, Journal of Applied Physics, 7(118), p. 071901, 2015

DOI: 10.1063/1.4927818

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Preface to Special Topic: Piezoresponse Force Microscopy

Journal article published in 2015 by Nina Balke ORCID, Nazanin Bassiri-Gharb, Céline Lichtensteiger
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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Abstract

The special issue of Journal of Applied Physics highlights how advances in data analysis and work towards quantification of not only piezoelectricity but also other electromechanical effects will strongly enhance the quality and reproducibility of piezoresponse force microscopy (PFM) experiments and expand the applications of PFM-type characterization techniques to a wider range of materials. Volk and co-researchers use electron beam irradiation to induce domains in LiNbO3 crystals and show that the domain size depends on the irradiation conditions and is related to a modified defect structure in a thin layer at the surface. Schroeder and colleagues lucidate the importance of the oxide-electrode interface and illustrate how interface oxidation of the electrodes during annealing results in a different density of oxygen vacancies in Gd:HfO2 films, which is ultimately responsible for the stabilization of the ferroelectric phase in these materials. Vasudevan and colleagues demonstrate advanced statistical data analysis methods for extraction of correlations in the measured data and expose hidden results.