Elsevier, Synthetic Metals, 1-3(101), p. 606-607
DOI: 10.1016/s0379-6779(98)01232-6
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High resolution electron energy loss spectra (HREELS) were recorded for quaterthiophene (4T) films and compared to those of quinquethiophene (5T) and sexithiophene (6T). Excitonic gap was evaluated to be 2.64±0.02 eV. A second threshold appearing in HREELS but not in optical spectra, is assigned to excitation of charge transfer levels with thresholds of 3.60±0.02, 3.24±0.02 and 2.97±0.02 eV for 4T, 5T and 6T respectively. Losses between 1.0 and 2.3 eV in 4T and 5T are assigned to S 0→T n transitions. Resonance mechanisms are responsible for induced excitations in the oligothiophene film surfaces.