Dissemin is shutting down on January 1st, 2025

Published in

Elsevier, Electrochimica Acta, 21(55), p. 6218-6227

DOI: 10.1016/j.electacta.2009.10.065

Links

Tools

Export citation

Search in Google Scholar

Determination of effective capacitance and film thickness from constant-phase-element parameters

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

Full text: Unavailable

Green circle
Preprint: archiving allowed
Red circle
Postprint: archiving forbidden
Red circle
Published version: archiving forbidden
Data provided by SHERPA/RoMEO

Abstract

Two different mathematical formulas for estimating effective capacitance from Constant-Phase-Element (CPE) parameters, taken from the literature, are associated unambiguously with either surface or normal time-constant distributions. Application to different systems are used to illustrate the importance of using the correct formula that corresponds to a given type of distribution. Experiments and simulations are used to show that the effective capacitance obtained for a normal distribution yields correct values for the film thickness under conditions where the local resistivity does not vary significantly. When the local resistivity varies considerably over the thickness of a film, the experimental frequency range may preclude observation of the capacitance contribution of a portion of the film, resulting in under prediction of the film thickness.