International Union of Crystallography, Journal of Applied Crystallography, 4(47), p. 1449-1451, 2014
DOI: 10.1107/s1600576714013909
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A simple procedure for the measurement of the degree of linear polarization at a synchrotron radiation station is described. The diffraction pattern from a glass plate set perpendicular to the incident beam is registered using a two-dimensional area detector. The intensity variation along the azimuth angle ρ at a constant diffraction angle is fitted to the theoretical cos2ρ dependence. The results of measurements performed at a synchrotron radiation station with a CCD detector on the beam from a bending magnet are presented.