Published in
Elsevier, Opto-Electronics Review, 1(20), p. 1-14
DOI: 10.2478/s11772-012-0008-z
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Aspects of nanometer scale imaging with extreme ultraviolet (EUV) laboratory sources
Journal article published in 2011 by
P. W. Wachulak 
,
M. C. Marconi,
A. Isoyan,
L. Urbanski,
A. Bartnik,
H. Fiedorowicz,
R. A. Bartels
,
M. C. Marconi,
A. Isoyan,
L. Urbanski,
A. Bartnik,
H. Fiedorowicz,
R. A. Bartels
This paper is made freely available by the publisher.
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