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American Institute of Physics, Applied Physics Letters, 1(107), p. 013903

DOI: 10.1063/1.4926331

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Enhanced Seebeck coefficient in silicon nanowires containing dislocations

Journal article published in 2015 by Nick S. Bennett, Daragh Byrne, Aidan Cowley ORCID
This paper is available in a repository.
This paper is available in a repository.

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Abstract

In recent years, research on thermoelectric (TE) materials has intensified—thanks to the exciting potential of low-dimensional structures such as nanowires. Experiments have shown that nano- structuring materials can greatly reduce their thermal transport properties, significantly enhancing thermoelectric performance. With reduced thermal conductivity, nano-structured silicon—which is plentiful and low-cost—becomes a competitive TE material, but still trails traditional TE materials in overall performance. In this study, we show that the creation of extended defects within the crys- tal structure of silicon nanowires can create an additional enhancement. Relative to regular silicon nanowires, extended defects lead to an increased Seebeck coefficient. The effect is a consequence of the creation of dislocations and dislocation-loops, intentionally introduced in the nanowires. These defects create nano-scale potential barriers which theoretical studies have predicted can enhance silicon’s thermopower by energy filtering of low-energy carriers. Although the defects slightly reduce carrier mobility—increasing electrical resistivity in the nanowires—their presence creates an overall two-fold enhancement in the thermoelectric power factor.