Dissemin is shutting down on January 1st, 2025

Published in

American Chemical Society, Journal of Physical Chemistry Letters, 16(5), p. 2796-2801, 2014

DOI: 10.1021/jz501119a

Links

Tools

Export citation

Search in Google Scholar

Silicon-Chip-Based Dielectric Spectroscopy for Conductivity and Molecular Dynamics Studies of Organic Films

This paper is available in a repository.
This paper is available in a repository.

Full text: Download

Green circle
Preprint: archiving allowed
  • Must obtain written permission from Editor
  • Must not violate ACS ethical Guidelines
Orange circle
Postprint: archiving restricted
  • Must obtain written permission from Editor
  • Must not violate ACS ethical Guidelines
Red circle
Published version: archiving forbidden
Data provided by SHERPA/RoMEO

Abstract

Interdigital electrodes fabricated by standard lithography on silicon chips are employed to probe the dipolar molecular dynamics and electric conduction properties of thin rhodamine films grown with two different methods. The conductivity is due to electronic charge carriers, and at around room-temperature, it is higher by 1 order of magnitude in solution-deposited films than in thermally evaporated ones. The organic material exhibits two intrinsic dynamic processes, of which the one at higher temperature is due to the orientational motion of the dipole moment of the rhodamine units, while the one at lower temperature is due to the motion of a local dipole associated with the chlorine counterions and is absent in thermally evaporated films. Our results show that thin-film dielectric spectroscopy is an easily implementable and versatile tool to extract valuable information on thin organic films. ; Peer Reviewed ; Postprint (published version)