Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Information Forensics and Security, (18), p. 3849-3861, 2023
DOI: 10.1109/tifs.2023.3287728
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Label Correlation in Deep Learning-Based Side-Channel Analysis
Journal article published in 2023 by
Lichao Wu 
,
Léo Weissbart,
Marina Krček ,
Huimin Li,
Guilherme Perin,
Lejla Batina ,
Stjepan Picek
,
Léo Weissbart,
Marina Krček ,
Huimin Li,
Guilherme Perin,
Lejla Batina ,
Stjepan Picek
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