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Atomic-scale measurement of localized dislocation phonons at Si/Ge interface

Published in 2022 by Y. Li, B. Han, R. Shi, R. Qi ORCID, X. Hao, N. Li, B. Liu, J. Du, J. Chen, P. Gao
This paper was not found in any repository; the policy of its publisher is unknown or unclear.
This paper was not found in any repository; the policy of its publisher is unknown or unclear.

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