Trapping processes and band discontinuities in Ga2O3 FinFETs investigated by dynamic characterization and optically-assisted measurements
Proceedings article published in 2021 by
Carlo De Santi,
Elena Fabris,
Alessandro Caria 
,
Matteo Buffolo,
Wenshen Li,
Kazuki Nomoto,
Zongyang Hu,
Debdeep Jena,
Huili Grace Xing,
Gaudenzio Meneghesso,
Enrico Zanoni,
Matteo Meneghini
,
Matteo Buffolo,
Wenshen Li,
Kazuki Nomoto,
Zongyang Hu,
Debdeep Jena,
Huili Grace Xing,
Gaudenzio Meneghesso,
Enrico Zanoni,
Matteo Meneghini
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