Published in
International Union of Crystallography, Journal of Synchrotron Radiation, 3(29), p. 755-764, 2022
DOI: 10.1107/s1600577522002284
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High-resolution electron time-of-flight spectrometers for angle-resolved measurements at the SQS Instrument at the European XFEL
,
Markus Ilchen ,
Alexander Achner,
Thomas M. Baumann,
Rebecca Boll ,
Jens Buck,
Cyril Danilevsky,
Sergey Esenov,
Benjamin Erk ,
Patrik Grychtol ,
Gregor Hartmann,
Jia Liu ,
Tommaso Mazza,
Jacobo Montaño,
Valerija Music
and other authors.
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Abstract
A set of electron time-of-flight spectrometers for high-resolution angle-resolved spectroscopy was developed for the Small Quantum Systems (SQS) instrument at the SASE3 soft X-ray branch of the European XFEL. The resolving power of this spectrometer design is demonstrated to exceed 10 000 (E/ΔE), using the well known Ne 1s −13p resonant Auger spectrum measured at a photon energy of 867.11 eV at a third-generation synchrotron radiation source. At the European XFEL, a width of ∼0.5 eV full width at half-maximum for a kinetic energy of 800 eV was demonstrated. It is expected that this linewidth can be reached over a broad range of kinetic energies. An array of these spectrometers, with different angular orientations, is tailored for the Atomic-like Quantum Systems endstation for high-resolution angle-resolved spectroscopy of gaseous samples.